The Department of Applied Physics of the University of Eastern Finland is equipped with Bruker D8 DISCOVER X-ray powder diffraction equipment.
The main components of the versatile XRPD equipment are:
An automatic sample changer
- 90 sample slots (six sample towers with 15 sample slots each), the robot inserts and removes the samples, Automatic measurement and saving of measurement data, If necessary, the Rietveld refinement of measured diffractograms can be automated, for the calculation of phase percentages, for example
The device is capable of rotating samples on two axes and moving them on the X-Y-Z grid. All axles are motorised and can be used in the placement and measurement of the sample. For bulk and powder samples, thin films and foils. Sample maximum height 40 mm and maximum weight 1 kg
The cradle enables the determination of texture (crystal orientation), residual stress, reflectometer (XRP) determination for the measurement of thin films, phase depth profiling (GID) with layered samples and measurements from microtiter plates, using precisely focused X-rays (microdiffraction and high throughput screening)
Capillary spinner (installation into the Euler cradle)
- Measurements taken in the capillaries, the capillary can be rotated during measurement, for powder samples, liquid samples and suspensions, can be used with small samples, used for pair distribution function analysis (PDF) in the study of the short-range order of nanocrystalline or amorphic materials, can be used for small-angle X-ray scattering measurements of colloid samples
An Anton Paar DCS 350 domed cooling stage (installation into the Euler cradle)
In situ diffraction measurements at low and elevated temperatures, From room temperature to +350 °C in air or inert gas, From -100 °C to +350 °C in a vacuum, Maximum sample diameter 25 mm
Installed in the Euler cradle, which allows the determination of the sample's texture at the desired temperature or monitoring of the phase transition as a function of temperature, among other functions
1 D detector, 192 channels, Possible to use with Cr, Co, Cu and Mo radiation, Electronic limitation of fluorescence radiation, to improve the signal-noise ratio of ferrous samples when using Cu radiation. Alternatively, Mo radiation can be used with ferrous samples.
Other notable facts
- Measurement using the normal Bragg-Brentano geometry or with parallel beam geometry (Goebel mirror). Also enables the measurement of uneven samples, Cu radiation (Kα1 0.1540562 nm) and Mo radiation (Kα1 0.070930 nm) capabilities, For texture determination and microdiffraction, the Cu pipe can be turned from a line focus to a point focus, When measuring with the Euler cradle, laser pointers for focusing the sample on the goniometer's primary and secondary circles are available, for the sample’s vertical adjustment. A video camera is attached to the goniometer for recording the sample during measurement, Versatile measurement and analysis software, which include Rietveld calculation